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DeCS
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Descriptor English:
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Microscopy, Electron, Scanning
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Descriptor Spanish:
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Microscopía Electrónica de Rastreo
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Descriptor Portuguese:
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Microscopia Eletrônica de Varredura
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Synonyms English:
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Electron Microscopies, Scanning
Electron Microscopy, Scanning
Electron Scanning Microscopies
Electron Scanning Microscopy
Microscopies, Electron Scanning
Microscopies, Scanning Electron
Microscopy, Electron Scanning
Microscopy, Scanning Electron
Scanning Electron Microscopies
Scanning Electron Microscopy
Scanning Microscopies, Electron
Scanning Microscopy, Electron
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Tree Number:
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E01.370.350.515.402.541
E05.595.402.541
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Definition English:
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Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. |
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Indexing Annotation English:
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do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM
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See Related English:
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Corrosion Casting
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History Note English:
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72(69)
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Allowable Qualifiers English:
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Record Number:
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23316
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Unique Identifier:
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D008855
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Occurrence in VHL:
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Similar:
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DeCS
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